Qubit Fabrication Yield: Wafer Defect Density Model

Every superconducting-qubit chip starts life on a wafer full of randomly scattered fabrication defects, and whether a given die becomes a working quantum processor comes down to whether any of those defects happens to land in its critical area. This simulator renders a real 100 mm wafer tiled with dies, scatters an actual Poisson-distributed defect map across it at an adjustable defect density, and tests each die's critical zone — sized by how many qubits it carries — individually. Green dies survive, red dies don't, amber dots mark every defect whether or not it mattered, and live readouts compare the measured yield against the theoretical e^(−D₀·A_crit) curve so you can see sampling noise around the real formula, plus how many good qubits the wafer actually delivers.