Qubit Fabrication Yield 2D: Wafer Defect Density Map

Every superconducting-qubit chip starts life on a wafer full of randomly scattered fabrication defects, and whether a given die becomes a working quantum processor comes down to whether any of those defects happens to land in its critical area. This top-down map renders a real 100 mm wafer tiled with dies, scatters an actual Poisson-distributed defect map across it at an adjustable defect density, and tests each die's critical zone — sized by how many qubits it carries — individually. Green dies survive, red dies don't, amber dots mark every defect whether or not it mattered, and a live convergence chart plots every wafer you've sampled against the theoretical e^(−D₀·A_crit) curve so you can see sampling noise settle around the real formula, alongside readouts for measured yield and how many good qubits the wafer actually delivers.