AFM Tip–Sample Force Curve: Snap-In & Pull-Off

This simulator drives a real damped cantilever equation of motion against the same van der Waals + DMT contact force law that governs a real atomic force microscope, so the mechanical snap-in as the tip is brought toward a sample — and the adhesive pull-off as it is withdrawn — emerge from the physics rather than being scripted. A live force–distance chart plots the tip-sample force curve alongside the cantilever's load line so you can see exactly where the two intersect (and where they can no longer, forcing the instability), while switching to tapping mode oscillates the piezo base and recovers amplitude and phase through the same lock-in demodulation a real instrument uses.