🔬 Wafer Die Yield: Defect Density, Poisson, Murphy and Clustered Defects (2D)

A silicon wafer map is inspected die by die while the page counts good and bad dies. Set wafer diameter, die area, defect density, defect clustering and wafer cost, and read how many dies fit, the yield by Poisson, Murphy, Seeds and negative-binomial models, and the cost per good die. Four numerical checks run in the page, including a 200,000-die simulation.