Potential-Induced Degradation (PID) in Solar Modules

Grid-tied PV strings sit at high voltage relative to the grounded aluminum frame, and that bias slowly drives sodium ions out of the module's soda-lime glass and into the cells nearest the frame edge. This simulator renders a real module cross-section — frame, glass, encapsulant and a cell grid — and advances an actual drift-diffusion front (an erfc profile driven by an Arrhenius temperature law) under adjustable voltage, temperature and humidity, matching the damp-heat/bias protocol used in IEC 62804 accelerated PID testing. Watch the ion cloud creep inward from the frame, the edge cells discolor and lose shunt resistance first, and the live readouts track leakage current, average shunt resistance and total power loss exactly as a field EL scan would reveal them.